Description
During in-circuit testing (ICT), each component of an electronic assembly is checked for faults. Short circuits, interruptions, soldering or component faults are detected and assemblies are rejected according to a go/no-go test.
During functional testing (FCT), the assemblies are tested completely or in partial areas for the intended operation. The function test of the modules is carried out in the end application or in an environment that simulates the end application.
Depending on the test item, the application and the operation conditions, Columbia provides the optimal solution:
- International standard contact probes, typical 50, 75 and 100 mill
- Metric contact probes
- Progressive Series for difficult conditions
- Bead probes
- Bare board probes
Björn Larsson
Head of Sales
Mats Klarholm
Senior Advisor and
Technical Sales
Sanel Merdovic
Head of Test and Service Department
Per Pedersen
Technical Sales and Projects
