6TL36 In-line Test Handler w/bypass

  • Test handler 6TL36 is able to test DUTs inside Faraday Chamber
  • Dual-line (bypass)
  • Expandable to form a group with several 6TL36 modules (adapt line to production volumes).

Description

The 6TL36 test handler is the first ATE handler on the market that easily integrates the radio frequency tests into mass production lines.

The modular approach of the 6TL36 offers the possibility of adding handlers together for a work in parallel that reduces the cycle time and saves costs as well as space when compared to traditional parallel solutions. Therefore, the system can be ordered with only one conveyor, with two conveyors (bypass or dual-line), and with three conveyors (Retour conveyor).

The 6TL36 is the best production solution to test the products that feature the latest challenges set out by the IoT and the manufacturing of connected products.

Advantages of 6TL36 In-line Test Handler:
  • ICT, FCT with RF, ISP, or Combined test (ICT+FCT)
  • Servo controlled DUT stop (stopper-less system)
  • Exchange time 3,2s
  • Max. PCB dimension 400x388mm (340x350mm for RF)
  • 19” rack space for instruments integration: 28UH
  • Receiver 25 slots in probe plate + 4 slots in push plate
  • Automatic Conveyor width adjustment
  • High dynamics conveyors (1500 mm/s)
  • 90mm Top-30mm Bottom Component clearance
  • SMEMA and Hermes standard
  • CE

Björn Larsson

Head of Sales

Mats Klarholm

Senior Advisor and
Technical Sales

Sanel Merdovic

Head of Test and Service Department

Per Pedersen

Technical Sales and Projects